Thin Solid Films, 102 (1983)L41
Conference Announcement November 13-19, 1983: Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS IV)
This conference will be held at the Minoo Kanko Hotel, Osaka, Japan. The topics treated will be fundamentals of sputtering and secondary ion formation, quantification of secondary ion mass spectrometry (SIMS), instrumentation (sources, analysers, detectors), depth profiling, imaging, static SIMS, SIMS of organic compounds, data processing, SIMS compared with or complemented by other surface analytical techniques, other techniques (laser microprobe mass spectrometry, accelerator-based SIMS etc.), applications to semiconductors, metals, biological and geological samples etc., and standard samples for quantitative SIMS. Abstracts of papers must reach the Local Organizing Committee not later than April 30, 1983. Forms for submission of abstracts and further information about the conference may be obtained from the chairman of the Local Organizing Committee: Professor Jun Ok~ino, Institute of Geological Sciences, College of General Education, Osaka University, 1-1 Machikaneyama-cho, Toyonaka, Osaka 560, Japan.
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